Coherent diffraction imaging (CDI) and ptychography [1] have been widely used in X-ray synchrotron sources. The advantage of ptychography over traditional CDI is that it does not need prior information about the probe function and overcomes some of the other issues of CDI, such as non-unique solutions and a limited field of view.
In electron microscopy, ptychography has also attracted...
Far-field electron ptychography is considered to be one of the most powerful phase retrieval techniques currently available for electron microscopists. Recently it was shown that ptychography is capable to surpass the Abbe resolution limit [1] and resolve specimens features as fine as the blurring due to the vibrations of the atoms [2]. A rather simple mathematical model of coherent...
Multislice ptychography has been used to characterize thicker samples in 3D dimensions with spatial resolution beyond the diffraction limit. When applied to the diffraction patterns collected by scanning transmission electron microscopes, multislice ptychography reconstructs the object as a series of slices with a lateral resolution of 10s of pm and a depth resolution of 2-3 nm. Further...
X-ray ptychography (NFP) is a coherent imaging technique widely used at synchrotron facilities, due to the ability to retrieve quantitative phase information of extended objects at a micrometric image resolution [1]. The advent of novel bright sources, an alternative to large-scale facilities, is paving the way for the translation of coherent X-ray imaging techniques outside synchrotrons and...
